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Selected ion monitoring

Selected ion monitoring (SIM) is a mass spectrometry scanning mode in which only a limited mass-to-charge ratio range is transmitted/detected by the instrument, as opposed to the full spectrum range. This mode of operation typically results in significantly increased sensitivity. Due to their inherent nature, this technique is most effective—and therefore most common—on quadrupole mass spectrometers, Orbitrap, and Fourier transform ion cyclotron resonance mass spectrometers.

References

References

  1. "selected ion monitoring".
  2. (2013). "Definitions of terms relating to mass spectrometry (IUPAC Recommendations 2013)". Pure and Applied Chemistry.
  3. Kaufmann, Anton. (2018). "Analytical performance of the various acquisition modes in Orbitrap MS and MS/MS". Journal of Mass Spectrometry.
  4. (2024). "Selected Ion Monitoring for Orbitrap-Based Metabolomics". Metabolites.
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This article was imported from Wikipedia and is available under the Creative Commons Attribution-ShareAlike 4.0 License. Content has been adapted to SurfDoc format. Original contributors can be found on the article history page.

mass-spectrometry
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