Scanning Hall probe microscope

Advantages to other magnetic raster scanning methods

SHPM is a superior magnetic imaging technique due to many reasons. Although MFM provides higher spatial resolution (~30 nm) imaging, unlike the MFM technique, the Hall probe exerts negligible force on the underlying magnetic structure and is noninvasive. Unlike the magnetic decoration technique, the same area can be scanned over and over again. The magnetic field caused by hall probe is so minimal it has a negligible effect on sample it is measuring. The sample does not need to be an electrical conductor, unless using STM for height control. The measurement can be performed from 5 – 500 K in ultra high vacuum (UHV) and is nondestructive to the crystal lattice or structure. Tests requires no special surface preparation or coating. The detectable magnetic field sensitivity, is approximately 0.1 uT – 10 T. SHPM can be combined with other scanning methods such as STM.

Limitations

There are some shortcomings or difficulties when working with an SHPM. High resolution scans become difficult due to the thermal noise of extremely small hall probes. There is a minimum scanning height distance due to the construction of the hall probe. (This is especially significant with 2DEG semi-conductor probes due to their multi-layer design). The scanning (lift) height affects obtained image. Scanning large areas takes a significant amount of time. There is a relatively short practical scanning range (order of 1000s micrometer) along any direction. The housing is important to shield electromagnetic noise (Faraday cage), acoustic noise (anti-vibrating tables), air flow (air isolation cupboard), and static charge on the sample (ionizing units).

References

References

1. (2016). "Nanoscale assembly of superconducting vortices with scanning tunnelling microscope tip". Nature Communications.
2. (1992). "Scanning Hall probe microscopy". Appl. Phys. Lett..