From Surf Wiki (app.surf) — the open knowledge base
Logic built-in self-test
Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits allowing them to test their own operation, as opposed to reliance on external automated test equipment.
Advantages
The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product.
Disadvantages
LBIST that requires additional circuitry (or read-only memory) increases the cost of the integrated circuit. LBIST that only requires temporary changes to programmable logic or rewritable memory avoids this extra cost, but requires more time to first program in the BIST and then to remove it and program in the final configuration. Another disadvantage of LBIST is the possibility that the on-chip testing hardware itself can fail; external automated test equipment tests the integrated circuit with known-good test circuitry.
Ask Mako anything about Logic built-in self-test — get instant answers, deeper analysis, and related topics.
Research with MakoFree with your Surf account
Create a free account to save articles, ask Mako questions, and organize your research.
Sign up freeThis content may have been generated or modified by AI. CloudSurf Software LLC is not responsible for the accuracy, completeness, or reliability of AI-generated content. Always verify important information from primary sources.
Report